Mechanisms controlling interface-properties in

IEEE Transactions on Applied Superconductivity

Volumn 9, Issue 2 PART 3, 1999, Pages 3405-3408

  Hilgenkamp, H ^a   Mannhart, J ^a  

^a UNIVERSITY OF AUGSBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL MICROSTRUCTURE; CRYSTAL SYMMETRY; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC RESISTANCE; GRAIN BOUNDARIES; INTERFACES (MATERIALS); JOSEPHSON JUNCTION DEVICES; MAGNETIC FLUX; SQUIDS; SUPERCONDUCTING FILMS; TRANSPORT PROPERTIES;

NORMAL STATE RESISTIVITY; NORMAL STATE TRANSPORT PROPERTIES; STEWART-MCCUMBER PARAMETER; SUPERCONDUCTING TRANSPORT PROPERTIES;

OXIDE SUPERCONDUCTORS;

EID: 0032669921     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.783760     Document Type: Article

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