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Volumn 112, Issue 1-2, 1999, Pages 1-12
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Impact of mesa and planar processes on the radiation hardness of Si detectors
a,b
a
CERN
(Switzerland)
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0032668451
PISSN: 03693546
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (3)
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References (12)
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