Image retrieval in the industrial environment

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3652, Issue , 1999, Pages 184-192

  Tobin, Kenneth W ^a   Karnowski, Thomas P ^a   Ferrell, Regina K ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATABASE SYSTEMS; DEFECTS; INFORMATION RETRIEVAL; PATTERN RECOGNITION; QUALITY CONTROL; SEMICONDUCTOR DEVICE MANUFACTURE;

CONTENT-BASED IMAGE RETRIEVAL (CBIR);

IMAGING SYSTEMS;

EID: 0032668381     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (121)