Method of searching segmentation parameters applied to quality control of industrial pieces

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3652, Issue , 1999, Pages 70-77

  Geveaux, P ^a   Kohler, S ^a   Miteran, J ^a   Truchetet, F ^a  

^a UNIVERSITÉ DE BOURGOGNE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; IMAGE SEGMENTATION; INSPECTION; PARAMETER ESTIMATION; QUALITY CONTROL;

DEFECT DETECTION; PARZEN'S KERNEL; SEARCHING SEGMENTATION PARAMETERS;

COMPUTER VISION;

EID: 0032666512     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (6)