메뉴 건너뛰기




Volumn 38, Issue 6 A/B, 1999, Pages

In situ growth monitoring during metalorganic chemical vapor deposition of YBa2Cu3Ox thin films by spectroscopic ellipsometry

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; ELLIPSOMETRY; FILM GROWTH; HIGH TEMPERATURE SUPERCONDUCTORS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; OXIDE SUPERCONDUCTORS; SPECTROSCOPIC ANALYSIS; STRONTIUM COMPOUNDS; SUPERCONDUCTIVITY; YTTRIUM BARIUM COPPER OXIDES;

EID: 0032666385     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.38.l632     Document Type: Article
Times cited : (6)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.