|
Volumn 38, Issue 6 A/B, 1999, Pages
|
In situ growth monitoring during metalorganic chemical vapor deposition of YBa2Cu3Ox thin films by spectroscopic ellipsometry
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CRYSTAL ATOMIC STRUCTURE;
ELLIPSOMETRY;
FILM GROWTH;
HIGH TEMPERATURE SUPERCONDUCTORS;
METALLORGANIC CHEMICAL VAPOR DEPOSITION;
OXIDE SUPERCONDUCTORS;
SPECTROSCOPIC ANALYSIS;
STRONTIUM COMPOUNDS;
SUPERCONDUCTIVITY;
YTTRIUM BARIUM COPPER OXIDES;
PSEUDODIELECTRIC FUNCTIONS;
STRONTIUM TITANATE;
SUPERCONDUCTING FILMS;
|
EID: 0032666385
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.38.l632 Document Type: Article |
Times cited : (6)
|
References (19)
|