Optimal eigenfeature selection by optimal image registration

Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition

Volumn 1, Issue , 1999, Pages 219-224

  Schweitzer, Haim ^a  

^a UNIVERSITY OF TEXAS AT DALLAS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTATIONAL COMPLEXITY; EIGENVALUES AND EIGENFUNCTIONS; HEURISTIC METHODS; IMAGE ANALYSIS; IMAGE QUALITY; ITERATIVE METHODS; OPTIMIZATION;

IMAGES COVARIANCE MATRIX; OPTIMAL EIGENFEATURE SELECTION; OPTIMAL IMAGE REGISTRATION;

COMPUTER VISION;

EID: 0032665712     PISSN: 10636919     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (19)