Strain monitoring by evanescent wave spectroscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3675, Issue , 1999, Pages 160-168

  Kapila, V ^a   Kjerengtroen, L ^a   Cross, W M ^a   Johnson, F J ^a   Kellar, J J ^a  

^a SOUTH DAKOTA SCHOOL OF MINES AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL SENSORS; FIBER OPTIC SENSORS; INFRARED SPECTROMETERS; INFRARED SPECTROSCOPY; INTELLIGENT MATERIALS; INTELLIGENT STRUCTURES; LIGHT ABSORPTION; NONDESTRUCTIVE EXAMINATION; OPTICAL FIBERS; REGRESSION ANALYSIS; STRAIN MEASUREMENT;

EVANESCENT WAVE SPECTROSCOPY;

COMPOSITE MATERIALS;

EID: 0032665228     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (13)