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Volumn 39, Issue 8, 1999, Pages 1219-1238

Uncertainty analysis and variation reduction of three-dimensional coordinate metrology. Part 2: Uncertainty analysis

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; MATRIX ALGEBRA; MEASUREMENT ERRORS; PROBABILITY; RANDOM PROCESSES; SENSITIVITY ANALYSIS;

EID: 0032664622     PISSN: 08906955     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0890-6955(98)00090-X     Document Type: Article
Times cited : (23)

References (11)
  • 1
    • 0026112872 scopus 로고
    • Localization of 3-D objects having complex sculptured surfaces using tactile sensing and surface description
    • Sahoo K.C., Menq C.H. Localization of 3-D objects having complex sculptured surfaces using tactile sensing and surface description. ASME J. Eng. Ind. 113(1):1991;85-92.
    • (1991) ASME J. Eng. Ind. , vol.113 , Issue.1 , pp. 85-92
    • Sahoo, K.C.1    Menq, C.H.2
  • 2
    • 0026845524 scopus 로고
    • Automated precision measurement of surface profile in CAD-directed inspection
    • Menq C.H., Yau H.T., Lai G.Y. Automated precision measurement of surface profile in CAD-directed inspection. IEEE Trans. Robotics Automation. 8(2):1992;268-278.
    • (1992) IEEE Trans. Robotics Automation , vol.8 , Issue.2 , pp. 268-278
    • Menq, C.H.1    Yau, H.T.2    Lai, G.Y.3
  • 4
    • 0025789180 scopus 로고
    • Uncertainties in the acquisition and utilization of coordinate frames in manufacturing systems
    • Shen Y.L., Duffie N.A. Uncertainties in the acquisition and utilization of coordinate frames in manufacturing systems. Ann. CIRP. 40:1991;527-530.
    • (1991) Ann. CIRP , vol.40 , pp. 527-530
    • Shen, Y.L.1    Duffie, N.A.2
  • 5
    • 0009389384 scopus 로고
    • Coordinate sampling and uncertainty analysis for computer integrated manufacturing and dimensional inspection
    • (The University of North Carolina, Charlotte, NC, 6-8 January
    • Z. Yan, C.H. Menq, Coordinate sampling and uncertainty analysis for computer integrated manufacturing and dimensional inspection, in: Proc. 1993 NSF Design and Manufacturing Systems Conference (The University of North Carolina, Charlotte, NC, 6-8 January 1993), pp. 1705-1712.
    • (1993) In: Proc. 1993 NSF Design and Manufacturing Systems Conference , pp. 1705-1712
    • Yan, Z.1    Menq, C.H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.