Optical properties of VO2 thin films in their dielectric and metallic states

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3738, Issue , 1999, Pages 102-109

  Petit, Christophe ^a   Frigerio, Jean Marc ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPSOMETRY; MICROSTRUCTURE; OPTICAL COATINGS; SEMICONDUCTOR MATERIALS; THIN FILMS; VANADIUM COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

SEMICONDUCTOR-METAL TRANSITION; THERMOCHROMISM; VANADIUM DIOXIDE;

OPTICAL FILMS;

EID: 0032664219     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (13)