Coating requirements for the reference flat of a Fizeau interferometer used for measuring from uncoated to highly reflecting surfaces

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3738, Issue , 1999, Pages 128-135

  Netterfield, R P ^a   Drage, D J ^a   Freund, C H ^a   Walsh, C J ^a   Leistner, A J ^a   Seckold, J A ^a   Oreb, B F ^a  

^a CSIRO   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

FIZEAU INTERFEROMETERS;

ELLIPSOMETRY; INTERFEROMETERS; LIGHT REFLECTION; LIGHT TRANSMISSION; SUBSTRATES;

OPTICAL COATINGS;

EID: 0032664218     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (6)