On the evaluation of arbitrary defect coverage of test sets

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1999, Pages 426-432

  Jain, Ankur ^a   Boppana, Vamsi ^a   Hsiao, Michael S ^a   Fujita, M ^a  

^a RUTGERS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; COMPUTER SIMULATION; FAILURE ANALYSIS; INTEGRATED CIRCUIT LAYOUT; MATHEMATICAL MODELS; VECTORS;

ARBITRARY DEFECT COVERAGE; FAULT MODEL;

INTEGRATED CIRCUIT TESTING;

EID: 0032664179     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (15)