Elaboration and characterization of yttrium implanted low manganese steel

Thin Solid Films

Volumn 350, Issue 1, 1999, Pages 168-172

  Caudron, E ^a   Buscail, H ^a   Cueff, R ^a   Jacob, Y P ^b   Stroosnijder, M F ^b  

^a UNIVERSITÉ CLERMONT AUVERGNE   (France)

^b JOINT RESEARCH CENTRE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CORROSION PROTECTION; ION IMPLANTATION; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; STEEL; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY; YTTRIUM;

GLANCING ANGLE X RAY DIFFRACTION (GAXRD); LOW MANGANESE STEEL;

PROTECTIVE COATINGS;

EID: 0032663893     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(99)00277-1     Document Type: Article

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