Low-energy electron diffraction, scanning tunneling microscopy and X-ray photoemission spectroscopy investigations of DMe-DCNQI on Cu(110)

Thin Solid Films

Volumn 342, Issue 1, 1999, Pages 307-311

  Kopf, H ^a   Seidel, C ^a   Fuchs, H ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSFER; COPPER; DEPOSITION; ELECTRONIC STRUCTURE; FILM PREPARATION; LOW ENERGY ELECTRON DIFFRACTION; MOLECULAR BEAMS; MOLECULAR ORIENTATION; MOLECULAR STRUCTURE; MONOLAYERS; SCANNING TUNNELING MICROSCOPY; THIN FILMS;

X-RAY PHOTOEMISSION SPECTROSCOPY;

CONDUCTIVE FILMS;

EID: 0032663731     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)01416-3     Document Type: Article

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