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Volumn 568, Issue , 1999, Pages 91-96

Ab-initio pseudopotential calculations of boron diffusion in silicon

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; DIFFUSION IN SOLIDS; FERMI LEVEL; SEMICONDUCTING BORON;

EID: 0032663592     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-568-91     Document Type: Article
Times cited : (5)

References (31)
  • 1
    • 33751123102 scopus 로고    scopus 로고
    • Defects and Diffusion in Silicon Processing
    • ed. by T. Diaz de la Rubia, S. Coffa, P. A. Stolk, and C. S. Rafferty Pittsburgh, PA
    • See, e.g., "Defects and Diffusion in Silicon Processing", ed. by T. Diaz de la Rubia, S. Coffa, P. A. Stolk, and C. S. Rafferty (Mater. Res. Proc. 469, Pittsburgh, PA 1997).
    • (1997) Mater. Res. Proc. , vol.469
  • 4
    • 85088713159 scopus 로고    scopus 로고
    • note
    • i-, and vice versa.
  • 7
    • 0031339421 scopus 로고    scopus 로고
    • "Defects and Diffusion in Silicon Processing", ed. by T. Diaz de la Rubia, S. Coffa, P. A. Stolk, and C. S. Rafferty Pittsburgh, PA
    • J. Zhu, in "Defects and Diffusion in Silicon Processing", ed. by T. Diaz de la Rubia, S. Coffa, P. A. Stolk, and C. S. Rafferty (Mater. Res. Proc. 469, Pittsburgh, PA 1997), p. 151.
    • (1997) Mater. Res. Proc. , vol.469 , pp. 151
    • Zhu, J.1
  • 10
    • 0032302291 scopus 로고    scopus 로고
    • "Semiconductor Process and Device Performance Modeling", ed. by S. T. Dunham and J. S. Nelson Pittsburgh, PA
    • M. Bunea and S. T. Dunham, in "Semiconductor Process and Device Performance Modeling", ed. by S. T. Dunham and J. S. Nelson (Mater. Res. Proc. 490, Pittsburgh, PA 1998), p. 3.
    • (1998) Mater. Res. Proc. , vol.490 , pp. 3
    • Bunea, M.1    Dunham, S.T.2
  • 11
    • 33751127320 scopus 로고    scopus 로고
    • Multiscale Modeling of Materials", ed. by T. Diaz de la Rubia, T. Kaxiras, V. Bulatov, N. M. Ghoniem, and R. Phillips Pittsburgh, PA
    • S. K. Theiss, M.-J. Caturla, T. Diaz de la Rubia, M. D. Johnson, A. Ural, and P. B. Griffin, in "Multiscale Modeling of Materials", ed. by T. Diaz de la Rubia, T. Kaxiras, V. Bulatov, N. M. Ghoniem, and R. Phillips (Mater. Res. Proc. 538, Pittsburgh, PA 1999).
    • (1999) Mater. Res. Proc. , vol.538
    • Theiss, S.K.1    Caturla, M.-J.2    Diaz De La Rubia, T.3    Johnson, M.D.4    Ural, A.5    Griffin, P.B.6
  • 20
    • 0001251555 scopus 로고    scopus 로고
    • Phys. Rev. B 55, 11 169 (1996).
    • (1996) Phys. Rev. B , vol.55 , pp. 11169
  • 22
    • 0031383526 scopus 로고    scopus 로고
    • "Defects and Diffusion in Silicon Processing", ed. by T. Diaz de la Rubia, S. Coffa, P. A. Stolk, and C. S. Rafferty Pittsburgh, PA
    • W. A. Harrison, in "Defects and Diffusion in Silicon Processing", ed. by T. Diaz de la Rubia, S. Coffa, P. A. Stolk, and C. S. Rafferty (Mater. Res. Proc. 469, Pittsburgh, PA 1997), p. 211.
    • (1997) Mater. Res. Proc. , vol.469 , pp. 211
    • Harrison, W.A.1
  • 25
    • 33751121157 scopus 로고    scopus 로고
    • H. Jonsson, G. Mills, K. W. Jacobsen, Enrico Fermi Summer School (Levici 1997) Proceedings
    • H. Jonsson, G. Mills, K. W. Jacobsen, Enrico Fermi Summer School (Levici 1997) Proceedings.
  • 26
    • 33751142783 scopus 로고    scopus 로고
    • In the following, GGA result will be denoted without, LDA results with parentheses
    • In the following, GGA result will be denoted without, LDA results with parentheses.
  • 30
    • 33751123974 scopus 로고    scopus 로고
    • to be published
    • W. Windl (to be published).
    • Windl, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.