Jitter and decision-level noise separation in A/D converters

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 3, Issue , 1999, Pages 1558-1562

  Tangelder, R J W T ^a   de Vries, H ^a   Rosing, R ^a   Kerkhoff, H G ^a   Sachdev, M ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRONIC EQUIPMENT TESTING; SIGNAL TO NOISE RATIO;

DECISION LEVEL NOISE; JITTERS;

ANALOG TO DIGITAL CONVERSION;

EID: 0032663286     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (9)