Effect of residual microstresses at crystalline multigrain junctions on the toughness of silicon nitride

Journal of the European Ceramic Society

Volumn 19, Issue 4, 1999, Pages 451-455

  Pezzotti, Giuseppe ^a   Kleebe, Hans Joachim ^b  

^a KYOTO INSTITUTE OF TECHNOLOGY   (Japan)

^b UNIVERSITY OF BAYREUTH   (Germany)

Author keywords

Microstructure final; Residual stress; Si3N4; Toughness; ZrO2.

Indexed keywords

CRYSTAL MICROSTRUCTURE; CRYSTAL STRUCTURE; CRYSTALLIZATION; FRACTURE MECHANICS; FRACTURE TOUGHNESS; INTERFACES (MATERIALS); MARTENSITIC TRANSFORMATIONS; RESIDUAL STRESSES; ZIRCONIA;

CRYSTALLINE MULTIGRAIN JUNCTIONS; RESIDUAL MICROSTRESSES;

SILICON NITRIDE;

EID: 0032663006     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0955-2219(98)00216-7     Document Type: Article

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