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Volumn 38, Issue 3 A, 1999, Pages 1534-1538

Change in the oxidation state of the adsorbed oxygen equilibrated at 25°C on ZnO surface during room temperature annealing after rapid quenching

Author keywords

ESR; Non ohmic; Oxidation state; Semiconductor; Surface; ZnO

Indexed keywords

ADSORPTION; ANNEALING; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC PROPERTIES; ELECTRON TRAPS; GRAIN BOUNDARIES; MAGNETIC VARIABLES MEASUREMENT; OXIDATION; OXYGEN; QUENCHING; SURFACE TREATMENT;

EID: 0032662996     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.38.1534     Document Type: Article
Times cited : (26)

References (15)
  • 1
    • 0011711786 scopus 로고
    • ed. E. Kaldis North-Holland, Amsterdam
    • G. Neumann: Current Topics in Materials Science, ed. E. Kaldis (North-Holland, Amsterdam 1981) Vol. 7, Pt. 1. p. 153.
    • (1981) Current Topics in Materials Science , vol.7 , Issue.1 PART , pp. 153
    • Neumann, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.