Radiation damage measurements in room-temperature semiconductor radiation detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 428, Issue 1, 1999, Pages 95-101

  Franks, Larry A ^a   A Brunett, Bruce ^a,b   Olsen, Richard W ^a   Walsh, David S ^c   Vizkelethy, Gyögy ^c,e   I Trombka, Jacob ^d   Doyle, Barney L ^c   James, Ralph B ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b CARNEGIE MELLON UNIVERSITY   (United States)

^c SANDIA NATIONAL LABORATORIES   (United States)

^d NASA GODDARD SPACE FLIGHT CENTER   (United States)

^e IDAHO STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; ALPHA PARTICLES; CHLORINE; GAMMA RAY SPECTROMETERS; INDIUM; LEAKAGE CURRENTS; MERCURY COMPOUNDS; NEUTRONS; PROTONS; RADIATION DAMAGE; SEMICONDUCTING CADMIUM COMPOUNDS;

CADMIUM TELLURIDE; CADMIUM ZINC TELLURIDE; CHARGED PARTICLE DAMAGE; ENERGY RESOLUTION; INTERSTRIP LEAKAGE; MERCURIC IODIDE; NEUTRON DAMAGE; RADIATION DAMAGE MEASUREMENTS; SEMICONDUCTOR RADIATION DETECTORS;

RADIATION DETECTORS;

EID: 0032662721     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(98)01585-X     Document Type: Article

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