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Volumn 57, Issue 3, 1999, Pages 224-227
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X-ray diffraction studies of epitaxial Pb(Zr,Ti)O3 films prepared by chemical solution method
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Author keywords
Pb(Zr,Ti)O3; Reciprocal space map; Tetragonal phase
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Indexed keywords
DOPING (ADDITIVES);
EPITAXIAL GROWTH;
FERROELECTRIC MATERIALS;
FILM GROWTH;
HEAT TREATMENT;
LANTHANUM COMPOUNDS;
LEAD COMPOUNDS;
NIOBIUM;
PYROLYSIS;
STRONTIUM COMPOUNDS;
THIN FILMS;
X RAY CRYSTALLOGRAPHY;
DIPPING-PYROLYSIS PROCESS;
LEAD ZIRCONATE TITANATE;
RECIPROCAL-SPACE MAP ANALYSIS;
STRONTIUM TITANATE;
DIELECTRIC FILMS;
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EID: 0032662167
PISSN: 02540584
EISSN: None
Source Type: Journal
DOI: 10.1016/S0254-0584(98)00223-5 Document Type: Article |
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Times cited : (4)
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References (8)
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