SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 349, Issue 1, 1999, Pages 171-175

Phase identification during aging of some nitrided ferrous materials

(3) Hinojosa, G a Oseguera, J a,b Schabes Retchkiman, P S a

a SCHOOL OF ENGINEERING AND SCIENCES (Mexico)

b INSTITUTO NACIONAL DE INVESTIGACIONES NUCLEARES (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; ANNEALING; HIGH RESOLUTION ELECTRON MICROSCOPY; METALLOGRAPHIC MICROSTRUCTURE; MICROHARDNESS; MORPHOLOGY; NITRIDING; QUENCHING; SCANNING ELECTRON MICROSCOPY; STEEL; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

FERROUS MATERIALS; IRON NITRIDE; PHASE IDENTIFICATION;

THIN FILMS;

EID: 0032661397 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(99)00196-0 Document Type: Article

Times cited : (8)

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