Identification of contact conditions from contaminated data of contact moment

Proceedings - IEEE International Conference on Robotics and Automation

Volumn 1, Issue , 1999, Pages 585-591

  Mouri, Tetsuya ^a   Yamada, Takayoshi ^a   Funahashi, Yasuyuki ^a   Mimura, Nobuharu ^a  

^a NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; EIGENVALUES AND EIGENFUNCTIONS; IMPURITIES; INDUSTRIAL ROBOTS; LEAST SQUARES APPROXIMATIONS; ROBOTIC ASSEMBLY; SPURIOUS SIGNAL NOISE;

CONTACT CONDITIONS; CONTACT MOMENT; CONTAMINATED DATA;

CONTACT SENSORS;

EID: 0032661087     PISSN: 10504729     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (15)