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Volumn , Issue , 1999, Pages 72-81
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Statistical dependence of oxide failure rates on Vdd and tox variations, with applications to process design, circuit design, and end use
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Author keywords
[No Author keywords available]
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Indexed keywords
APPROXIMATION THEORY;
DIELECTRIC PROPERTIES;
ELECTRIC BREAKDOWN;
ELECTRIC FIELDS;
ELECTRIC POTENTIAL;
ELECTRIC POWER SUPPLIES TO APPARATUS;
FAILURE ANALYSIS;
INTEGRATED CIRCUIT LAYOUT;
OXIDES;
STATISTICAL METHODS;
AVERAGE FAILURE RATE;
DIELECTRIC WEAROUT;
GATE OXIDE;
POWER SUPPLY VOLTAGE;
INTEGRATED CIRCUIT TESTING;
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EID: 0032660955
PISSN: 00999512
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
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Times cited : (20)
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References (10)
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