Characteristic temperature dependence of the maximum josephson current in Bi-Sr-Ca-Cu-O intrinsic junctions

IEEE Transactions on Applied Superconductivity

Volumn 9, Issue 2 PART 3, 1999, Pages 4511-4514

  Suzuki, Minoru ^a  

^a Kashino Diverse Brain Research Laboratory of NTT Communication Science Laboratories   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENT MEASUREMENT; ELECTRON TUNNELING; HIGH TEMPERATURE SUPERCONDUCTORS; OXIDE SUPERCONDUCTORS; SINGLE CRYSTALS; THERMAL EFFECTS; TUNNEL JUNCTIONS;

INTRINSIC JUNCTION EFFECT; TEMPERATURE DEPENDENCE;

JOSEPHSON JUNCTION DEVICES;

EID: 0032660537     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.784028     Document Type: Article

References (16)

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