Measurement-methods comparisons and linear statistical relationship

Technometrics

Volumn 41, Issue 3, 1999, Pages 192-201

  Tan, Charles Y ^a   Iglewicz, Boris ^b  

^a MERCK RESEARCH LABORATORIES   (United States)

^b TEMPLE UNIVERSITY   (United States)

Author keywords

Confidence interval for slope; Equivalence test; Errors in variable regression; Measurement error model

Indexed keywords

CALIBRATION; ERROR ANALYSIS; INDUSTRIAL APPLICATIONS; MEASUREMENT ERRORS; QUALITY CONTROL; REGRESSION ANALYSIS;

ACCURACY; CONFIDENCE INTERVAL; EQUIVALENCE TEST; ERRORS-IN-VARIABLE REGRESSION; LINEAR STATISTICAL RELATIONSHIP; MEASUREMENT ERROR MODEL; PRECISION;

MATHEMATICAL MODELS;

EID: 0032660108     PISSN: 00401706     EISSN: 15372723     Source Type: Journal    
DOI: 10.1080/00401706.1999.10485668     Document Type: Article

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