Moire deflectometry based on Fourier-transform analysis

Measurement: Journal of the International Measurement Confederation

Volumn 25, Issue 4, 1999, Pages 249-253

  Wang, Boxiong ^a   Luo, Xiuzhi ^a   Pfeifer, T ^b   Mischo, H ^b  

^a TSINGHUA UNIVERSITY   (China)

^b FRAUNHOFER INSTITUTE FOR PRODUCTION TECHNOLOGY IPT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION GRATINGS; FOURIER TRANSFORMS; LEAST SQUARES APPROXIMATIONS; MOIRE FRINGES; PHASE SHIFT; SURFACE MEASUREMENT; SURFACES;

ASPHERIC SURFACE MEASUREMENT; DECLINATION ERROR; LEAST SQUARE FITTING; LIGHT DEFLECTION; MOIRE DEFLECTOGRAMS; MOISE DEFLECTOMETRY; PHASE SHIFTING; RONCHI GRATING LINES;

OPTICAL VARIABLES MEASUREMENT;

EID: 0032660095     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0263-2241(99)00009-3     Document Type: Article

References (8)

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