Study of aged Langmuir-Blodgett monolayers by AFM and ToF-SIMS mapping

Surface and Interface Analysis

Volumn 27, Issue 5, 1999, Pages 396-400

  Pignataro, B ^a   Panebianco, S ^a   Consalvo, C ^a   Licciardello, A ^a  

^a UNIVERSITY OF CATANIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; AGING OF MATERIALS; ATOMIC FORCE MICROSCOPY; BARIUM COMPOUNDS; DESORPTION; FRICTION; MONOLAYERS; ORGANIC ACIDS; SECONDARY ION MASS SPECTROMETRY; SILICON; SURFACES;

BARIUM CHLORIDE; CHEMICAL IMAGING; HYDROPHILIC PLASMA OXIDIZED SILICON SURFACES; INTERACTION FORCE MAPS; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY;

LANGMUIR BLODGETT FILMS;

EID: 0032659408     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199905/06)27:5/6<396::AID-SIA504>3.0.CO;2-Q     Document Type: Article

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