Trap theory of combined aging under electrical and thermal stress in polymers and its test verification

Zhongguo Dianji Gongcheng Xuebao/Proceedings of the Chinese Society of Electrical Engineering

Volumn 19, Issue 2, 1999, Pages 70-74

  Li, Zhonghua ^a   Yin, Yi ^a   Zhu, Jun ^a   Tu, Demin ^a  

^a XI'AN JIAOTONG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; ELECTRIC FIELD EFFECTS; ELECTRON TRAPS; POLYMERS; THERMAL EFFECTS;

COMBINED STRESS AGING; POLYMER INSULATION;

INSULATING MATERIALS;

EID: 0032658536     PISSN: 02588013     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (5)