Open circuit voltage decay lifetime of ion irradiated devices

Microelectronics Journal

Volumn 30, Issue 6, 1999, Pages 513-520

  Vobecky J ^a   Hazdra, P ^a   Zahlava V ^a  

^a CZECH TECHNICAL UNIVERSITY IN PRAGUE   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; DIODES; ION BOMBARDMENT;

OPEN CIRCUIT VOLTAGE DECAY;

POWER ELECTRONICS;

EID: 0032658292     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2692(98)00173-6     Document Type: Article

References (11)

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