Multiple fault detection and isolation using the haar transform, part 1: Theory

Journal of Manufacturing Science and Engineering, Transactions of the ASME

Volumn 121, Issue 2, 1999, Pages 290-294

  Koh, C K H ^a   Shi, J ^b   Williams, W J ^b   Ni, J ^b  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^b UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HAAR TRANSFORM; LIKELIHOOD RATIO TEST; MULTIPLE FAULT DETECTION; NEYMAN-PEARSON CRITERIA; PROCESS MONITORING SIGNALS; UNIFORMLY MOST POWERFUL FORM;

FEATURE EXTRACTION; MANUFACTURE; MATHEMATICAL TRANSFORMATIONS; MAXIMUM LIKELIHOOD ESTIMATION; MEASUREMENTS; PROCESS ENGINEERING; SPECIFICATIONS;

FAULT TREE ANALYSIS;

EID: 0032658154     PISSN: 10871357     EISSN: 15288935     Source Type: Journal    
DOI: 10.1115/1.2831218     Document Type: Article

References (9)

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