Mini-deflectometer for measuring optical finish quality

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3739, Issue , 1999, Pages 363-368

  van Amstel, W D ^a   Baumer, S M B ^a   Couweleers, F C ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

FAST FOURIER TRANSFORMS; MAGNETIC HEADS; ROUGHNESS MEASUREMENT; TELEVISION;

MINI-DEFLECTOMETERS;

OPTICAL VARIABLES MEASUREMENT;

EID: 0032657936     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (1)