FLASH system for fast and accurate pattern localization

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3652, Issue , 1999, Pages 164-173

  Lai, Shang Hong ^a   Fang, Ming ^a  

^a SIEMENS CORPORATE RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; FACTORY AUTOMATION; INDUSTRIAL APPLICATIONS; INSPECTION;

FAST LOCALIZATION WITH ADVANCED SEARCH HIERARCHY (FLASH) ALGORITHM; OBJECT LOCALIZATION;

COMPUTER VISION;

EID: 0032656942     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (8)