Sensitivity of a method to predict a capacitor's frequency characteristic

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 3, Issue , 1999, Pages 1829-1833

  Avramov Zamurovic, Svetlana ^a   Koffman, Andrew D ^a   Oldham, Nile M ^a   Waltrip, Bryan C ^a  

^a UNITED STATES NAVAL ACADEMY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; ELECTRIC IMPEDANCE MEASUREMENT; ELECTRIC NETWORK ANALYSIS; FREQUENCIES; REGRESSION ANALYSIS;

CAPACITOR FREQUENCY CHARACTERISTIC PREDICTION (CFCP) METHOD; DISSIPATION FACTOR; UNCERTAINTY ANALYSIS;

CAPACITORS;

EID: 0032656024     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (9)