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Applied Physics A: Materials Science and Processing

Volumn 69, Issue 3, 1999, Pages 333-336

Permanent holographic recording in indium oxide thin films using 193 nm excimer laser radiation

(8) Pissadakis, S a Mailis, S a Reekie, L a Wilkinson, J S a Eason, R W a Vainos, N A b Moschovis, K b Kiriakidis, G b

a UNIVERSITY OF SOUTHAMPTON (United Kingdom)

b INSTITUTE OF ELECTRONIC STRUCTURE AND LASER (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION GRATINGS; EXCIMER LASERS; HELIUM NEON LASERS; HOLOGRAPHY; INDIUM COMPOUNDS; LASER BEAM EFFECTS; OPTICAL DATA STORAGE; PARTIAL PRESSURE; PRESSURE EFFECTS; REFRACTIVE INDEX; SPUTTERING; ULTRAVIOLET RADIATION;

INDIUM OXIDE; PERMANENT HOLOGRAPHIC RECORDING;

OPTICAL FILMS;

EID: 0032656021 PISSN: 09478396 EISSN: None Source Type: Journal
DOI: 10.1007/s003390051009 Document Type: Article

Times cited : (22)

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