Evidence of ω-phase in ion beam sputtered zirconium thin films

Thin Solid Films

Volumn 342, Issue 1, 1999, Pages 93-99

  Pichon, L ^a   Girardeau, T ^a   Lignou, F ^a   Straboni, A ^a  

^a UNIVERSITÉ DE POITIERS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ARGON; COMPRESSIVE STRESS; FILM GROWTH; GRAIN SIZE AND SHAPE; ION BEAMS; PRESSURE EFFECTS; SPUTTER DEPOSITION; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; ZIRCONIUM;

X RAY ABSORPTION;

METALLIC FILMS;

EID: 0032655516     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)01425-4     Document Type: Article

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