Analysis of snapback behavior on the ESD capability of sub-0.20 μm NMOS

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1999, Pages 159-166

  Amerasekera, Ajith ^a   Gupta, Vikas ^a   Vasanth, Karthik ^a   Ramaswamy, Sridhar ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT COMPOUNDS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC DISCHARGES; ELECTRIC RESISTANCE; ELECTROSTATICS; OXIDES; SEMICONDUCTOR JUNCTIONS; SUBSTRATES; TITANIUM COMPOUNDS;

ELECTRO STATIC DISCHARGE; SNAPBACK BEHAVIOR;

MOS DEVICES;

EID: 0032655294     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (11)