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Volumn 38, Issue 7 B, 1999, Pages

Laser-induced damage threshold and surface processing of GaN at 400 nm wavelength

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; EPITAXIAL GROWTH; FILM GROWTH; LASER ABLATION; LASER PULSES; OPTICAL MICROSCOPY; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTOR GROWTH; ULTRAFAST PHENOMENA;

EID: 0032655286     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.38.l839     Document Type: Article
Times cited : (28)

References (0)
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