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Journal of Materials Science

Volumn 34, Issue 16, 1999, Pages 3853-3858

Physical and dielectric properties of Bi4-xRxSr3Ca3Cu2O10 glasses (x = 0.5 and R = Ag, Ni)

(2) Memon, A a Tanner, D B a

a University of Florida (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; ELECTRIC CONDUCTIVITY MEASUREMENT; INFRARED SPECTROSCOPY; LIGHT REFLECTION; NICKEL; PERMITTIVITY; SEMICONDUCTING BISMUTH COMPOUNDS; SILVER; X RAY DIFFRACTION ANALYSIS;

HOPPING ENERGY;

SEMICONDUCTING GLASS;

EID: 0032655055 PISSN: 00222461 EISSN: None Source Type: Journal
DOI: 10.1023/A:1004662420571 Document Type: Article

Times cited : (4)

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