Deuterium transport in Cu, CuCrZr, and Cu/Be

Journal of Nuclear Materials

Volumn 266, Issue , 1999, Pages 761-765

  Anderl, R A ^a   Hankins, M R ^a   Longhurst, G R ^a   Pawelko, R J ^a  

^a Lockheed Martin Idaho Technology Company   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; COPPER; COPPER ALLOYS; DEUTERIUM; DIFFUSION IN SOLIDS; ION BEAMS; ION IMPLANTATION; MECHANICAL PERMEABILITY; SOLUBILITY;

ARRHENIUS PRE-EXPONENTIALS; SURFACE MOLECULAR RECOMBINATION COEFFICIENTS;

TOKAMAK DEVICES;

EID: 0032654012     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3115(98)00878-2     Document Type: Article

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