Technique for rapid characterization of intermetallics and interfaces

Intermetallics

Volumn 7, Issue 9, 1999, Pages 1001-1009

  Moreno, D ^a   Garrett, J ^b   Embury, J D ^c  

^a NUCLEAR RESEARCH CENTER NEGEV   (Israel)

^b MCMASTER UNIVERSITY   (Canada)

^c MCMASTER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BINARY ALLOYS; COPPER ALLOYS; DISSOLUTION; FRACTURE; INTERFACES (MATERIALS); MICROHARDNESS; SCANNING ELECTRON MICROSCOPY; SOLIDIFICATION; TOUGHNESS; TRANSMISSION ELECTRON MICROSCOPY;

COPPER ALUMINIDE;

INTERMETALLICS;

EID: 0032653641     PISSN: 09669795     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0966-9795(99)00020-5     Document Type: Article

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