Carrier dynamics and THz radiation in biased semiconductor structures

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3617, Issue , 1999, Pages 49-56

  Piao, Z S ^a   Tani, M ^a   Sakai, K ^a  

^a National Institute of Information and Communications Technology   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; HOLE TRAPS; MATHEMATICAL MODELS; PHOTOCURRENTS; PULSED LASER APPLICATIONS; SEMICONDUCTOR DEVICE STRUCTURES; ULTRAFAST PHENOMENA;

BIASED SEMICONDUCTOR STRUCTURES; TERAHERTZ SPECTROSCOPY;

SPECTROSCOPIC ANALYSIS;

EID: 0032652303     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (20)