Electric field profile in μc-Si:H p-i-n devices

Materials Research Society Symposium - Proceedings

Volumn 507, Issue , 1999, Pages 181-186

  Wyrsch, N ^a   Beck, N ^a   Meier, J ^a   Torres, P ^a   Shah, A ^a  

^a UNIVERSITY OF NEUCHÂTEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CRYSTALLINE MATERIALS; ELECTRIC FIELDS; GRAIN BOUNDARIES;

ELECTRIC FIELD PROFILE; MICROCRYSTALLINE SILICON;

SILICON SOLAR CELLS;

EID: 0032651731     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)