Anisotropy in wear processes measured by scanning probe microscopy

Thin Solid Films

Volumn 340, Issue 1, 1999, Pages 40-44

  Schouterden, Kris ^a   Lairson, Bruce M ^a  

^a Rice University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; CARBON; COATINGS; DIAMOND FILMS; FRICTION; MATHEMATICAL MODELS; PROBES; TEXTURES; WEAR OF MATERIALS;

FRICTION FORCE IMAGE; OVERCOAT; SCANNING PROBE MICROSCOPY;

AMORPHOUS MATERIALS;

EID: 0032651602     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)01341-8     Document Type: Article

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