Strain measurement for Raman-inactive substrates with PbO thin films using Raman Coating Method

Journal of Materials Science

Volumn 34, Issue 1, 1999, Pages 105-110

  Miyagawa, H ^a   Kamiya, D ^a   Sato, C ^a   Ikegami, K ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON FIBER REINFORCED PLASTICS; COATING TECHNIQUES; RAMAN SPECTROSCOPY; RESIDUAL STRESSES; STRAIN MEASUREMENT; THIN FILMS; VAPOR DEPOSITION;

LEAD OXIDE; PHYSICAL VAPOR DEPOSITION (PVD); RAMAN COATING METHOD;

LEAD COMPOUNDS;

EID: 0032651509     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1004421826443     Document Type: Article

References (6)

1. E. ANASTASSAKIS, A. PINCZUK, F. POLLAK, and M. CARDONA, Solid State Commun. 8 (1970) 133.
2. F. CERDEIRA, C. BUCHENAUER, F. POLLAK, and M. CARDONA, Phys. Rev. B5 (1972) 580.
3. F. TUINSTRA, and J. KOENIG, J. Chem Phys. 53 (1970) 1126.
4. H. SAKATA, G. DRESSELHAUS, M. S. DRESSELHAUS, and M. ENDO, J. App. Phy. 63 (1988) 2769.
5. P. W. VAN DEN HEUVEL, T. PEIJS, and R. J. YOUNG, Mat. Sci. Let. 15 (1996) 1908.
6. S. GANESAN, A. MARADUDIN, and J. OITMAA, Ann. Phy. 56 (1970) 556.