Experimentally validated thermal model of thin film NiTi

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3668, Issue II, 1999, Pages 617-629

  Favelukis, Jenna E ^a   Lavine, Adrienne S ^a   Carman, Gregory P ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COOLING; FREQUENCY RESPONSE; HEAT LOSSES; MATHEMATICAL MODELS; NICKEL ALLOYS; PHASE TRANSITIONS; SHAPE MEMORY EFFECT; THIN FILMS;

NICKEL-TITANIUM ALLOYS;

INTELLIGENT MATERIALS;

EID: 0032651263     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (16)