Quantitative shearography in axisymmetric gas temperature measurements

Optics and Lasers in Engineering

Volumn 31, Issue 1, 1999, Pages 21-39

  VanDerWege, Brad A ^a   O'Brien, Christopher J ^a   Hochgreb, Simone ^a  

^a Massachusetts Institute of Technology Cambridge   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FOURIER TRANSFORMS; TEMPERATURE MEASUREMENT;

COMBUSTION DIAGNOSTICS; FOURIER TRANSFORM-BASED FRINGE PATTERN ANALYSIS; SHEAROGRAPHY;

INTERFEROMETERS;

EID: 0032651236     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0143-8166(98)00045-1     Document Type: Article

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