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Volumn 35, Issue 5, 1999, Pages 363-364
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Application of linearly independent arithmetic transform in testing of digital circuits
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Author keywords
[No Author keywords available]
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Indexed keywords
DIGITAL ARITHMETIC;
ERROR DETECTION;
INTEGRATED CIRCUIT TESTING;
LOGIC CIRCUITS;
MATHEMATICAL TRANSFORMATIONS;
VECTORS;
FAULT DETECTION;
LINEARLY INDEPENDENT ARITHMETIC;
LOGIC TRANSFORMATIONS;
SPECTRAL COEFFICIENTS;
DIGITAL CIRCUITS;
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EID: 0032650447
PISSN: 00135194
EISSN: None
Source Type: Journal
DOI: 10.1049/el:19990280 Document Type: Article |
Times cited : (13)
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References (6)
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