EIS combined with SERS: A tool to study the adsorption of S2O32- and PMT in silver electroplating conditions

Electrochimica Acta

Volumn 44, Issue 24, 1999, Pages 4129-4137

  Gonnissen, D ^a   Hubin, A ^a   Vereecken, J ^a  

^a VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; CAPACITANCE; DEPOSITION; ELECTRIC IMPEDANCE MEASUREMENT; ELECTRIC POTENTIAL; ELECTROLYTES; INTERFACES (MATERIALS); RAMAN SPECTROSCOPY; SILVER PLATING; SULFUR COMPOUNDS;

SURFACE ENHANCED RAMAN SPECTROSCOPY (SERS); THIOSULFATE;

ELECTROPLATING;

EID: 0032649439     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0013-4686(99)00127-9     Document Type: Article

References (35)

1. Hubin A., Vereecken J. J. Appl. Electrochem. 24:1994;239.
2. Hubin A., Vereecken J. J. Appl. Electrochem. 24:1994;396.
3. Vandeputte S., Tribollet B., Hubin A., Vereecken J. Electrochim. Acta. 33:1994;2729.
4. Vandeputte S., Verboom, Hubin A., Vereecken J. J. Electroanal. Chem. 397:1995;249.
5. Gonnissen D., Vandeputte S., Hubin A., Vereecken J. Electrochim. Acta. 41:1996;1051.
6. Vandeputte S., Hubin A., Vereecken J. Electrochim. Acta. 42:1997;3429.
7. Simons W., Gonnissen D., Hubin A. J. Electroanal. Chem. 433:1997;141.
8. Gonnissen D., Simons W., Hubin A. J. Electroanal. Chem. 435:1997;149.
9. Mcdonald J.R. Impedance Spectroscopy. 1987;Wiley, New York.
10. Sanda P.N., Demuth J.E., Tsang J.C., Warlaumont J.N. Chang R.K., Furtak T.E. Surface Enhanced Raman Scattering. 1982;189 Plenum, New York.
11. M. Spiekermann, B. Schrader (Eds.), Infrared and Raman Spectroscopy, ch. 5.1, VCH, Weinheim, 1995.
12. J. Lipkowski, L. Stolberg, J. Lipkowski, P.N. Ross (Eds.), Adsorption of molecules at metal electrodes, ch. 4, VCH, New York, 1992.
13. B. Pettinger, J. Lipkowski, P.N. Ross (Eds.), Adsorption of Molecules at Metal Electrodes, ch. 6, VCH, New York, 1992.
14. Burstein E., Lundqvist S. Chang R.K., Furtak T.E. Surface Enhanced Raman Scattering. 1982;67 Plenum, New York.
15. Pettinger B., Wetzel H. Chang R.K., Furtak T.E. Surface Enhanced Raman Scattering. 1982;293 Plenum, New York.
16. Moskovits M., Dilella D.P. Chang R.K., Furtak T.E. Surface Enhanced Raman Scattering. 1982;243 Plenum, New York.
17. D. Gonnissen, A. Hubin, J. Vereecken, S.A. Asher, P.B. Stein (Eds.), Proceedings of the 15th International Conference on Raman Spectroscopy (11-16/8/1996), Pittsburgh, Wiley, Chichester, 1996, p. 596.
18. T.H. James, T.H. James (Eds.), The Theory of the Photographic Process, 4th ed., ch. 13, Macmillan, New York, 1977.
19. G.I.P. Levenson, T.H. James (Eds.), The Theory of the Photographic Process, 4th ed., ch.15, Macmillan, New York, 1977.
20. Gonnissen D., Langenaeker W., Hubin A., Geerlings P. J. Raman. Spectr. 29:1998;1031.
21. D.E. Irish, T. Ozeki, Grasselli, B.J. Bulkin (Eds.), Analytical Raman spectroscopy, ch. 4, Wiley, New York, 1991.
22. Hester R.E. Compr. Chem. Kin. 29:1989;79.
23. Huang Y., Wu G. Spectrochim. Acta. 45A:1989;123.
24. Tadayyoni M.A., Farquharson S., Li Tomi T-T., Weaver M.J. J. Phys. Chem. 88:1984;470.
25. Weaver M.J., Barz F., Gordon J.G. II, Philpott M.R. Surf. Sci. 125:1983;409.
26. Hupp J.T., Larkin D., Weaver M.J. Surf. Sci. 125:1983;429.
27. Hatta A., Sasaki Y., Suëtaka W. J. Electroanal. Chem. 160:1984;321.
28. Wetzel H., Gerischer H., Pettinger B. Chem. Phys. Lett. 80:1981;159.
29. Tian Z.Q., Li W.H., Mao B.W., Zou S.Z., Gao J.S. Appl. Spectrosc. 50:1986;1569.
30. Mason L.F.A. J. Phot. Sci. 16:1968;177.
31. Liu C-Y., Zhang Z-Z., Ren X-M. J. Photogr. Sci. 41:1993;30.
32. Brandt E.S. Appl. Spectr. 47:1993;85.
33. Dollish F.R., Fateley W.G., Bentley F.F. Characteristic Raman frequencies of organic groups. 1974;Wiley, New York. Chap. 12.
34. Liu C-Y., Ren Y-Z., Ren X-M. J. Inf. Rec. Mats. 22:1994;113.
35. D. Gonnissen, A. Hubin, J. Vereecken, Proceedings of the 6th European Conference on Applications of Surface and Interface Analysis (8-13/10/1995), Montreux, Wiley, New York, 1996, p. 196.