Automated generation of SPICE characterization test masks and test databases

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 1999, Pages 74-79

  Kasel, Leo ^a   McAndrew, Colin C ^a   Drennan, Patrick ^a   Davis, William F ^a   Ida, Richard ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED SOFTWARE ENGINEERING; COMPUTER SIMULATION; DATABASE SYSTEMS; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING;

SOFTWARE PACKAGE SPICE;

MASKS;

EID: 0032649294     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (3)