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Volumn 74, Issue 1, 1999, Pages 77-80

Compositional gradient in and mechanical stability of RF-sputtered and RTA annealed Pb(Zr,Ti)O3 thin films

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION THEORY; CRYSTAL ORIENTATION; CRYSTALLIZATION; FERROELECTRICITY; LEAD COMPOUNDS; MAGNETRON SPUTTERING; POLARIZATION; RAPID THERMAL ANNEALING; SECONDARY ION MASS SPECTROMETRY; STABILITY; SUBSTRATES; THIN FILMS;

EID: 0032648985     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(98)00351-3     Document Type: Article
Times cited : (6)

References (9)
  • 1
    • 0029292162 scopus 로고
    • Ferroelectric thin film technology for semiconductor memory
    • Moazzami R. Ferroelectric thin film technology for semiconductor memory. Semicond. Sci. Technol. 10:1995;375-390.
    • (1995) Semicond. Sci. Technol. , vol.10 , pp. 375-390
    • Moazzami, R.1
  • 4
    • 0024664343 scopus 로고
    • Properties of DC magnetron sputtered lead zirconate titanate thin films
    • Sreenivas K., Sayer M., Garett P. Properties of DC magnetron sputtered lead zirconate titanate thin films. Thin Solid Films. 172:1989;251-267.
    • (1989) Thin Solid Films , vol.172 , pp. 251-267
    • Sreenivas, K.1    Sayer, M.2    Garett, P.3
  • 6
    • 0022107473 scopus 로고
    • Analysis of the effect of electrical conductance of ferroelectric polymers on D-E hysteresis curves measured by the Tower-Sawyer method
    • Ikeda S., Kobayashi S., Wada Y. Analysis of the effect of electrical conductance of ferroelectric polymers on D-E hysteresis curves measured by the Tower-Sawyer method. J. Polym. Sci. 23:1985;1513-1521.
    • (1985) J. Polym. Sci. , vol.23 , pp. 1513-1521
    • Ikeda, S.1    Kobayashi, S.2    Wada, Y.3
  • 7
    • 0030363807 scopus 로고    scopus 로고
    • Ferroelectric PLZT thin films deposited by RF triode magnetron sputtering for spatial light modulators
    • East Brunswick, NJ, USA, August 18-21
    • B. Tonaboylu, P.C. Harvey, F. Deng, C. Fan, S. Esener, Ferroelectric PLZT thin films deposited by RF triode magnetron sputtering for spatial light modulators, IEEE 10th Int. Symp. on Applications of Ferroelectrics (ISAF), East Brunswick, NJ, USA, August 18-21, 1996, pp. 675-678.
    • (1996) IEEE 10th Int. Symp. on Applications of Ferroelectrics (ISAF) , pp. 675-678
    • Tonaboylu, B.1    Harvey, P.C.2    Deng, F.3    Fan, C.4    Esener, S.5
  • 8
    • 36449002472 scopus 로고
    • Investigation of Pt/Ti bilayer metallization on silicon for ferroelectric thin film integration
    • Sreenivas K., Reaney I., Maeder T., Setter N. Investigation of Pt/Ti bilayer metallization on silicon for ferroelectric thin film integration. J. Appl. Phys. 75(1):1994;232-239.
    • (1994) J. Appl. Phys. , vol.75 , Issue.1 , pp. 232-239
    • Sreenivas, K.1    Reaney, I.2    Maeder, T.3    Setter, N.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.