메뉴 건너뛰기




Volumn 15, Issue 2, 1999, Pages 101-104

Fractal dimension: Measure of coating quality

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ATOMIC FORCE MICROSCOPY; COATINGS; EVAPORATION; FILM GROWTH; FRACTALS; GOLD; SCANNING TUNNELING MICROSCOPY; SILICON WAFERS; SURFACE MEASUREMENT; SURFACE ROUGHNESS; THIN FILMS;

EID: 0032648780     PISSN: 02670844     EISSN: None     Source Type: Journal    
DOI: 10.1179/026708499101516344     Document Type: Article
Times cited : (7)

References (14)
  • 4
    • 0038261541 scopus 로고
    • New York, NY, Plenum
    • J. FEDER: 'Fractals'; 1989, New York, NY, Plenum.
    • (1989) Fractals
    • Feder, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.