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Volumn 15, Issue 2, 1999, Pages 101-104
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Fractal dimension: Measure of coating quality
a,b a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM;
ATOMIC FORCE MICROSCOPY;
COATINGS;
EVAPORATION;
FILM GROWTH;
FRACTALS;
GOLD;
SCANNING TUNNELING MICROSCOPY;
SILICON WAFERS;
SURFACE MEASUREMENT;
SURFACE ROUGHNESS;
THIN FILMS;
FRACTAL DIMENSION;
METALLIC FILMS;
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EID: 0032648780
PISSN: 02670844
EISSN: None
Source Type: Journal
DOI: 10.1179/026708499101516344 Document Type: Article |
Times cited : (7)
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References (14)
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